- Ensure accurate testing and aging of QFP64, LQFP64, and TQFP64 chips with our reliable Burn-In socket, designed for optimal stability and dependability. - The socket's robust construction guarantees secure connections, making it essential for precise chip testing and efficient performance during extended aging tests. - Ideal for semiconductor engineers, electronic lab technicians, and professionals seeking high-quality tools for chip testing and aging processes. - Perfect for electronics manufacturing workshops that conduct batch aging tests and labs verifying chip performance and long-term stability. - Features a compatible design that accommodates various chip sizes, enhancing usability across different testing environments. - Built for durability, the Burn-In socket supports rigorous testing demands, ensuring consistent results that you can trust. - Use scenarios include validating the performance of new semiconductor designs in research labs, conducting reliability testing for production batches, and performing quality assurance on electronic components before assembly.