- Ensures precise testing and aging of QFP64, LQFP64, and TQFP64 chips using a burn-in socket for stability and reliability. - The socket design provides a secure, reliable interface for accurate pin testing and efficient performance during extended burn-in cycles. - This burn-in socket is suitable for electronics manufacturing facilities performing batch aging tests and for laboratories verifying chip performance and long-term stability. - Optimizes chip test workflows with a burn-in socket and guarantees compatibility with QFP64, LQFP64, and TQFP64 packaged chips for consistent results. - Use scenarios: - In a high-volume electronics production line, conduct batch aging tests on QFP64 family chips to screen for early-life failures before shipment. - In reliability labs or R&D settings, perform accelerated burn-in and long-term stability tests on new QFP64 devices to validate performance under stressed conditions. - In service centers or test labs, verify replacement or refurbished QFP64 chips after repair to ensure they meet durability standards.