Timing memory power dissipation testing and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook experts from around the world provide in-depth discussions on these and related topics. Stacked gate embedded and flash memory all receive detailed treatment including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs) an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures layout methods design verification testability concepts and various CAD tools. Language: English