- Ensure safe and accurate testing of QFP64/LQFP64/TQFP64 chips with our reliable burn-in socket, designed for prolonged aging tests. - Achieve precise performance metrics with a burning base that anchors the chip for stability and enhances reliability. - Streamline your chip testing workflows with optimized compatibility for QFP64/LQFP64/TQFP64 packaging, resulting in consistent and dependable results. - Ideal for electronics manufacturing workshops focused on batch aging tests, this burner socket supports laboratories in evaluating chip performance and long-term stability. - Applications include quality assurance in production lines and research settings where consistent chip testing and validation are crucial. - Constructed from high-quality materials, this socket delivers excellent durability and performance for extensive testing requirements. - Enhance your testing protocols with a solution that simplifies processes while ensuring rigorous evaluation standards are met.