- Ensure precise testing and aging of QFP64, LQFP64, and TQFP64 chips with our reliable Burn-In Socket, designed for optimal stability and performance. - The robust design of the socket guarantees secure connections, enabling accurate chip tests and efficient aging processes, even during extended test durations. - Ideal for semiconductor engineers, electronic lab technicians, and professionals requiring dependable tools for chip testing and aging. - This burn-in socket is perfect for electronics manufacturing workshops conducting batch aging tests and laboratories assessing chip performance and long-term reliability. - Compatible with a range of chip types, the socket’s sturdy construction supports rigorous testing environments. - Applications include: - Testing the reliability of new chip designs in R&D settings. - Conducting long-duration stress tests to ensure product longevity before market release. - Facilitating quality control processes in electronics manufacturing. - Trust in our burn-in socket to enhance your chip testing and aging procedures, ensuring that every component meets high standards of quality and performance.